Dimension 9000 AFM
- OEM: Veeco
Description:
Revolutionize Your Semiconductor Metrology with Dimension 9000 Series AFM. Achieve unparalleled precision and efficiency with the Dimension 9000 - your fully automated, fab-ready Atomic Force Microscope designed for modern semiconductor processes. Why Choose the Dimension 9000? • Unmatched Precision: Sub-nanometer resolution for features down to 0.18µm and below. • Fully Automated: Push-button operation with automated tip evaluation and exchange. • Versatile Applications: Perfect for etch trench/recess measurements, DRAM process control, HSG analysis, defect characterization, and more. • High Throughput: Analyze up to 40 wafer sites per hour with recipe-driven workflows. • Non-Destructive Analysis: Safeguard yields with accurate 3D measurements without damaging wafers. Key Features: • TipX™ Automatic Tip Exchange: No operator intervention needed. • NanoScript™ Automation: Simplify scanning, measurement, and reporting. • Advanced Defect Characterization: Integrated optics and TappingMode™ for superior defect insights. • Compact Design: Cleanroom-compatible with integrated acoustic and vibration isolation. Fully Serviced and Warranty Included! This tool has been fully serviced, calibrated, and includes a comprehensive warranty for your peace of mind. Boost yields, reduce costs, and ensure process excellence with the Dimension 9000 Series - field-proven by semiconductor leaders worldwide.
In Stock